Atomic force microscope anodic oxidation studied by spectroscopic microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1509121
Reference16 articles.
1. Positioning single atoms with a scanning tunnelling microscope
2. In-plane gates and nanostructures fabricated by direct oxidation of semiconductor heterostructures with an atomic force microscope
3. Si nanostructures fabricated by anodic oxidation with an atomic force microscope and etching with an electron cyclotron resonance source
4. Basic properties of GaAs oxide generated by scanning probe microscope tip-induced nano-oxidation process
5. Oxidation states in scanning-probe-induced Si3N4 to SiOx conversion studied by scanning photoemission microscopy
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