Doppler broadening positron annihilation spectroscopy: A technique for measuring open-volume defects in silsesquioxane spin-on glass films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.123815
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1. VLSI on-chip interconnection performance simulations and measurements
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3. Influence of the Cure Process on the Properties of Hydrogen Silsesquioxane Spin-On-Glass
4. Interaction of positron beams with surfaces, thin films, and interfaces
5. Theory of positrons in solids and on solid surfaces
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