Annealing enhanced ferromagnetic resonance of thickness-dependent FeGa films

Abstract

We report the influence of different annealing temperatures on the magnetic property of FeGa thin films. The measurement was done for the film thickness from 42 to 420 nm. Our results show that the annealing temperature affects not only the microstructure but also the ferromagnetic resonance signal of the film. Annealing of a FeGa film improves the in-plane remanence ratio and reduces the in-plane ferromagnetic resonance linewidth by a factor of five. This annealing treatment promotes film texture and releases compressive stresses in the film. Our results demonstrate that the structural control via annealing is viable. The necessary magnetic softness of the FeGa film for microwave applications can be achieved.