Secondary‐ion mass spectrometry (SIMS) analysis of electron‐bombarded soda‐lime‐silica glass
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90828
Reference11 articles.
1. Outgassing Caused by Electron Bombardment of Glass
2. Oxygen Outgassing Caused by Electron Bombardment of Glass
3. Electron‐Probe Microanalysis of Alkali Metals in Glasses
4. Depth profiling of sodium in SiO2films by secondary ion mass spectrometry
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