Scattering and recoiling imaging spectrometer (SARIS)
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1148826
Reference21 articles.
1. Direct recoil spectrometry
2. Scattering and Recoiling Spectrometry: An Ion's Eye View of Surface Structure
3. Experimental realisation of low-energy surface channeling
4. Apparatus for low‐energy ion scattering spectroscopies: Imaging angular distributions and collecting angle‐resolved energy spectra
5. Time‐of‐flight scattering and recoiling spectrometer (TOF‐SARS) for surface analysis
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2. Electron-ion/atom coincidence measurements of 3keV He+ interacting with a SiH(100)-(2×1) surface;Surface Science;2005-12
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4. Scattering and recoiling mapping of the Kr-Pt(111) and Ne-Ni(111) systems by SARIS;e-Journal of Surface Science and Nanotechnology;2004
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