Time‐of‐flight scattering and recoiling spectrometer (TOF‐SARS) for surface analysis
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1141488
Reference47 articles.
1. Surface geometry determination by large-angle ion scattering
2. Surface stoichiometry, structure, and chemisorption on silicon nitride studied by direct recoiling, x‐ray photoelectron spectroscopy, and Auger electron spectroscopy
3. Detection of surface atoms by energy analysis of scattered primaries and recoiled secondaries from CsBr under Ar+ and Ar+ bombardment
4. Detection of surface atoms by energy analysis of scattered primaries and recoiled secondaries from CsBr under Ar+ and Ar+ bombardment
5. Initial adsorption kinetics of oxygen on polycrystalline copper
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