Numerical calculation of the temperature evolution and profile of the field ion emitter in the pulsed‐laser time‐of‐flight atom probe-Reference-Cited by-同舟云学术

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Numerical calculation of the temperature evolution and profile of the field ion emitter in the pulsed‐laser time‐of‐flight atom probe

Published:1984-11 Issue:11 Volume:55 Page:1779-1784
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Liu H. F.,Tsong T. T.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1137658

Reference9 articles.

1. The Atom‐Probe Field Ion Microscope

2. Field ion image formation

3. Photon-induced field ionization mass spectroscopy

4. Pulsed‐laser atom‐probe field‐ion microscopy

5. Pulsed‐laser time‐of‐flight atom‐probe field ion microscope

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