Pt/PbZrxTi1−xO3 interfacial reaction and Schottky barrier formation studied by x-ray photoelectron spectroscopy: Effect of H2 and O2 annealing
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.370585
Reference18 articles.
1. Interaction of PbZrxTi1-xO3(PZT) with Ni: role of surface defects
2. The effects of the catalytic nature of capacitor electrodes on the degradation of ferroelectric Pb(Zr,Ti)O3 thin films during reductive ambient annealing
3. Hydrogen-related Degradation and Recovery Phenomena in Pb(Zr,Ti)O3Capacitors with a Platinum Electrode
4. Electrode‐induced degradation of Pb(ZrxTi1−x)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin‐film capacitors
5. Effect of $\bf H_{2}$ Annealing on a $\bf Pt/PbZr_{\ninmbi x}Ti_{1-{\ninmbi x}}O_{3}$ Interface Studied by X-Ray Photoelectron Spectroscopy
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