Direct evaluation method to measure permittivity and conductivity of thin layers via wave approach in the THz region-Reference-Cited by-同舟云学术

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Direct evaluation method to measure permittivity and conductivity of thin layers via wave approach in the THz region

Published:2019-11-01 Issue:11 Volume:9 Page:115113
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Kwak Yunsang¹^ORCID,Park Sang Mok¹,Lee Sinyeob²,Kim Hak-Sung¹,Lee Ju³,Park Junhong¹^ORCID

Affiliation:

1. Department of Mechanical Engineering, Hanyang University, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea

2. Samsung Electronics Co., 158 Baebang-ro, Asan-si, Chungcheongnam-do 31489, South Korea

3. Department of Electrical Engineering, Hanyang University, 222 Wangsimni-ro, Seongdong-gu, Seoul 04763, South Korea

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5115092

Reference36 articles.

1. A review of the semiconductor properties of PbTe, PbSe, PbS and PbO

2. Higher permittivity rare earth doped HfO2 for sub-45-nm metal-insulator-semiconductor devices

3. On the Dispersion of Resistivity and Dielectric Constant of Some Semiconductors at Audiofrequencies

4. The FEM analysis of FGM piezoelectric semiconductor problems

5. Using microwave near-field reflection measurements as a non-destructive test to determine water penetration depth of concrete

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