Instrument for research on interfaces and surfaces
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144524
Reference19 articles.
1. Chapter 7. X-Ray spectroscopy
2. Apport de la photoémission inverse à l’étude des états électroniques inoccupés dans les interfaces
3. Electron distributions at bulk nickel-solid interfaces examined by electron induced X-ray emission spectroscopy
4. Soft x-ray spectroscopy as a method for studying chemical interactions at deep interfaces
5. Electronic structure of Ni-Al interfaces
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