Soft x-ray spectroscopy as a method for studying chemical interactions at deep interfaces-Reference-Cited by-同舟云学术

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Soft x-ray spectroscopy as a method for studying chemical interactions at deep interfaces

Published:1989 Issue: Volume:86 Page:1293-1302
ISSN:0021-7689
Container-title:Journal de Chimie Physique
language:
Short-container-title:J. Chim. Phys.

Author:

Bonnelle Christiane,Vergand Françoise

Publisher

EDP Sciences

Subject

Biochemistry

Link

http://jcp.edpsciences.org/10.1051/jcp/19898601293/pdf

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application of soft x-ray emission spectroscopy for the study of solid-phase reactions in Si-based interfaces;X-Ray Spectrometry;2002

2. L'étude expérimentale des ségrégations : quelles méthodes pour quels résultats ?;Le Journal de Physique IV;1999-04

3. Characterization method of the valence states : Application to dielectrics and metal-dielectrics interfaces;Le Journal de Physique IV;1998-12

4. Comparison of Cu-MgO Interfaces Studied by EXES and XPS;Surface Review and Letters;1998-02

5. Study of the adhesion between a-CH films and TA6V substrates by electron-induced X-ray emission spectroscopy (EXES);Thin Solid Films;1997-08

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