Ultrafast electron microscopy integrated with a direct electron detection camera-Reference-Cited by-同舟云学术

Ultrafast electron microscopy integrated with a direct electron detection camera

Published:2017-07 Issue:4 Volume:4 Page:044023
ISSN:2329-7778
Container-title:Structural Dynamics
language:en
Short-container-title:Structural Dynamics

Author:

Lee Young Min¹,Kim Young Jae¹²,Kim Ye-Jin¹²,Kwon Oh-Hoon¹²

Affiliation:

1. Department of Chemistry, School of Natural Science, Ulsan National Institute of Science and Technology (UNIST), 50 UNIST-gil, Ulsan 44919, South Korea

2. Center for Soft and Living Matter, Institute for Basic Science (IBS), 50 UNIST-gil, Ulsan 44919, South Korea

Publisher

AIP Publishing

Subject

Spectroscopy,Condensed Matter Physics,Instrumentation,Radiation

Link

http://aca.scitation.org/doi/pdf/10.1063/1.4983226

Reference38 articles.

1. A. H. Zewail , in Les Prix Nobel: The Nobel Prizes 1999, edited by T. Frängsmyr ( Almqvist & Wiksell, Stockholm, 2000), pp. 103–203.

2. 4D Imaging of Transient Structures and Morphologies in Ultrafast Electron Microscopy

3. Femtosecond electron imaging of defect-modulated phonon dynamics

4. Nanoscale Mechanical Drumming Visualized by 4D Electron Microscopy

5. Observing in space and time the ephemeral nucleation of liquid-to-crystal phase transitions

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