Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL
Author:
Affiliation:
1. Synchrotron SOLEIL, L’Orme Des Merisiers, Saint Aubin, 91192 Gif sur Yvette Cedex, France
2. Brookhaven National Laboratory, NSLS II, Upton, New York 11973-5000, USA
Funder
Brookhaven National Laboratory
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5055284
Reference20 articles.
1. High-efficiency B_4C/Mo_2C alternate multilayer grating for monochromators in the photon energy range from 07 to 34 keV
2. Cr/B4C multilayer mirrors: Study of interfaces and X-ray reflectance
3. Characterization of optical surfaces for the present generations of synchrotron sources
4. Technical Report: Metrology and Test Beamline at SOLEIL
5. Numerical and experimental study of grating efficiency for synchrotron monochromators
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