Temperature dependent electrical characteristics of a junction field effect transistor for cryogenic sub-attoampere charge detection
Author:
Affiliation:
1. Faculty of Physics, University of Duisburg-Essen and Center for Nanointegration Duisburg-Essen (CENIDE), Lotharstr.1, 47048 Duisburg, Germany
Funder
Deutsche Forschungsgemeinschaft
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5077039
Reference19 articles.
1. The possibility for using an amplifier at low temperatures
2. S. M. Sze and K. K. Ng, Physics of semiconductor devices, 3rd ed. (Wiley-Interscience, 2006), p. 23; pp. 80-100; pp. 374-400.
3. Thermal effects in JFET and MOSFET devices at cryogenic temperatures
4. Carrier density fluctuation noise in silicon junction field effect transistors at low temperatures
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