In situ monitoring of the effects of hydrogen on Pb(Zr,Ti)O3 structure
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3592295
Reference37 articles.
1. Ferroelectric non-volatile memories for low-voltage, low-power applications
2. Ferroelectrics for non-volatile memories
3. Effects of Pb/Pt Top Electrode on Hydrogen-Induced Degradation in Pb(Zr,Ti)O3
4. Electrode dependence of hydrogen-induced degradation in ferroelectric Pb(Zr,Ti)O3 and SrBi2Ta2O9 thin films
5. Electrode‐induced degradation of Pb(ZrxTi1−x)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin‐film capacitors
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