Large-field high-contrast hard x-ray Zernike phase-contrast nano-imaging beamline at Pohang Light Source
Author:
Funder
Korean Ministry of Science and Technology
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4789362
Reference10 articles.
1. 30nm resolution x-ray imaging at 8keV using third order diffraction of a zone plate lens objective in a transmission microscope
2. Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement
3. Hard x-ray Zernike microscopy reaches 30 nm resolution
4. Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm
5. How I Discovered Phase Contrast
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2. Exploring spectroscopic X-ray nano-imaging with Zernike phase contrast enhancement;Scientific Reports;2022-02-21
3. Synchrotron radiation based X-ray techniques for analysis of cathodes in Li rechargeable batteries;RSC Advances;2022
4. Zernike phase-contrast full-field transmission X-ray nanotomography for 400 micrometre-sized samples;Journal of Synchrotron Radiation;2020-10-21
5. Hard x-ray phase-contrast microscopy using a Gabor hologram without a zero-order term;Applied Optics;2020-07-06
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