30nm resolution x-ray imaging at 8keV using third order diffraction of a zone plate lens objective in a transmission microscope-Reference-Cited by-同舟云学术

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30nm resolution x-ray imaging at 8keV using third order diffraction of a zone plate lens objective in a transmission microscope

Published:2006-11-27 Issue:22 Volume:89 Page:221122
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Yin Gung-Chian,Song Yen-Fang,Tang Mau-Tsu,Chen Fu-Rong,Liang Keng S.,Duewer Frederick W.,Feser Michael,Yun Wenbing,Shieh Han-Ping D.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2397483

Reference15 articles.

1. Cryo X-ray microscopy with high spatial resolution in amplitude and phase contrast

2. X-ray microscopy in Zernike phase contrast mode at 4 keV photon energy with 60 nm resolution

3. Energy-tunable transmission x-ray microscope for differential contrast imaging with near 60nm resolution tomography

4. High-efficiency multilevel zone plates for keV X-rays

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