Bias stress in organic thin-film transistors and logic gates
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1394718
Reference6 articles.
1. Materials and Fabrication Needs for Low-Cost Organic Transistor Circuits
2. Bias-stress induced instability of organic thin film transistors
3. Charge trapping instabilities of sexithiophene Thin Film Transistors
4. Charge trapping instabilities in amorphous silicon‐silicon nitride thin‐film transistors
5. High-performance all-polymer integrated circuits
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