Impact of Applied Voltage on Threshold Voltage Instability in Active Load Thin-Film a-IGZO Inverters

Author:

Garcia Rodolfo1ORCID,Rodriguez-Lopez Ovidio2,Rocha-Flores Pedro E.3,Mejia Israel4ORCID,Hernandez-Como Norberto5ORCID,Voit Walter E.6,Gutierrez-Heredia Gerardo7

Affiliation:

1. Centro Universitario UAEM Ecatepec, Universidad Autónoma del Estado de México, Ecatepec, México

2. Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA

3. Department of Bioengineering, The University of Texas at Dallas, Richardson, TX, USA

4. Centro de Ingeniería y Desarrollo Industrial, Queretaro, México

5. Centro de Nanociencias y Micro y Nanotecnologías, Instituto Politécnico Nacional, Ciudad de México, México

6. Department of Material Science and Engineering and the Department of Mechanical Engineering, The University of Texas at Dallas, Richardson, TX, USA

7. Departamento de Fisica, Universidad de Sonora, Hermosillo, México

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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