Dielectric characterization in a broad frequency and temperature range of SrBi2Nb2O9 thin films grown on Pt electrodes
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1904726
Reference31 articles.
1. A family of ferroelectric bismuth compounds
2. Fatigue-free ferroelectric capacitors with platinum electrodes
3. Structure and Device Characteristics of SrBi2Ta2O9-Based Nonvolatile Random-Access Memories
4. Preparation and characterization of SrBi2Nb2O9 thin films made by polymeric precursors
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