Structural, dielectric, ferroelectric and optical properties of PBCT, PBST and PCST complex thin films on LaNiO3 metallic conductive oxide layer coated Si substrates by the CSD technique-Reference-Cited by-同舟云学术

Structural, dielectric, ferroelectric and optical properties of PBCT, PBST and PCST complex thin films on LaNiO3 metallic conductive oxide layer coated Si substrates by the CSD technique

Published:2014-10 Issue: Volume:609 Page:33-39
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Pontes D.S.L.,Chiquito A.J.,Pontes F.M.,Longo E.

Funder

FAPESP

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference41 articles.

1. Ferroelectricity at the Nanoscale: Local Polarization in Oxide Thin Films and Heterostructures

2. Preface: Science of ferroelectric thin films and application to devices

3. Ferroelectric properties of PZT/BFO multilayer thin films prepared using the sol-gel method

4. Structural and ferroelectric properties of europium doped lead zirconate titanate thin films by a sol–gel method

5. Effect of Double Doping in Lead Zirconate Titanate (PZT) Lattices by Sol-Gel Technique for MEMS Applications

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