X-ray diffraction study of undercooled molten silicon-Reference-Cited by-同舟云学术

X-ray diffraction study of undercooled molten silicon

Published:2001-01-29 Issue:5 Volume:78 Page:604-606
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kimura Hidekazu,Watanabe Masahito,Izumi Koichi,Hibiya Taketoshi,Holland-Moritz Dirk,Schenk Thomas,Bauchspieß Karl Rudolf,Schneider Stephan,Egry Ivan,Funakoshi Kenichi,Hanfland Michael

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1341220

Reference20 articles.

1. A review of measurement of thermophysical properties of silicon melt

2. Measurement of the density and the thermal expansion coefficient of molten silicon using electromagnetic levitation

3. Densities of Si determined by an image digitizing technique in combination with an electrostatic levitator

4. Dynamics, Spin Fluctuations, and Bonding in Liquid Silicon

5. Molecular-dynamics study on atomistic structures of liquid silicon

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