Electrostatic actuator probe with curved electrodes for time-of-flight scanning force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3469796
Reference11 articles.
1. Atomic Force Microscope
2. Switchable cantilever for a time-of-flight scanning force microscope
3. Switchable cantilever fabrication for a novel time-of-flight scanning force microscope
4. A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry
5. Functional Microcantilever for a Novel Scanning Force Microscope
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