A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2082004
Reference17 articles.
1. Atomic species identification in scanning tunneling microscopy by time-of-flight spectroscopy
2. Atomic species identification in STM using an imaging atom-probe technique
3. Tungsten silicide formation on an STM tip during atom manipulation
4. Single Silicon Atom Detection on a Tungsten Tip
5. Combined atom probe and STM study of tip-substrate interactions
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