Competitive gettering of iron in silicon photovoltaics: Oxide precipitates versus phosphorus diffusion-Reference-Cited by-同舟云学术

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Competitive gettering of iron in silicon photovoltaics: Oxide precipitates versus phosphorus diffusion

Published:2014-08-07 Issue:5 Volume:116 Page:053514
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Murphy J. D.¹,McGuire R. E.²,Bothe K.³,Voronkov V. V.⁴,Falster R. J.⁴

Affiliation:

1. School of Engineering, University of Warwick, Coventry CV4 7AL, United Kingdom

2. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom

3. Institut für Solarenergieforschung Hameln/Emmerthal, Am Ohrberg 1, 31860 Emmerthal, Germany

4. SunEdison, viale Gherzi 31, 28100 Novara, Italy

Funder

Royal Academy of Engineering

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://scitation.aip.org/deliver/fulltext/aip/journal/jap/116/5/1.4892015.pdf?itemId=/content/aip/journal/jap/116/5/10.1063/1.4892015&mimeType=pdf&containerItemId=content/aip/journal/jap

Reference31 articles.

1. Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging

2. Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

3. Recombination activity of contaminated dislocations in silicon: A model describing electron-beam-induced current contrast behavior

4. Electronic states at dislocations and metal silicide precipitates in crystalline silicon and their role in solar cell materials

5. On the mechanism of recombination at oxide precipitates in silicon

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1. A review of defect mitigation strategies for UMG-Si wafers;Frontiers in Photonics;2024-01-10

2. Application of Confocal Laser Scanning Microscopy to Investigation of Micro Crystals in Transparent Amorphous Media: Photoluminescence Tomography and Spectroscopy of Cdznsse Crystallites in Historical Silicate Glass;2024

3. Investigating Wafer Quality in Industrial Czochralski‐Grown Gallium‐Doped p‐Type Silicon Ingots with Melt Recharging;Solar RRL;2023-06-15

4. Influence of Heat Treatment on Lateral Lifetime Charge Carriers and Its Homogeneity in n-type Silicon Wafers;Journal of Communications Technology and Electronics;2023-03

5. Thermal-Fluctuation Mechanism of Long-Term Corrosion of Glass Caused by Internal Stress: Processes of Depolymerization, Impurity Migration and Fracturing on An Atomic Scale;SSRN Electronic Journal;2023

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