1. C. Auth, presented at the Custom Integrated Circuits Conference (CICC) (IEEE, 2012).
2. C. E. Smith, H. Adhikari, S.H. Lee, B. Coss, S. Parthasarathy, C. Young, B. Sassman, M. Cruz, C. Hobbs, and P. Majhi, presented at the Electron Devices Meeting (IEDM) (IEEE International, 2009).
3. S. Borkar, presented at the Design Automation Conference, DAC'09. 46th ACM/IEEE (2009).
4. In Search of “Forever,” Continued Transistor Scaling One New Material at a Time
5. T. Ghani, M. Armstrong, C. Auth, M. Bost, P. Charvat, G. Glass, T. Hoffmann, K. Johnson, C. Kenyon, and J. Klaus, presented at the Electron Devices Meeting, IEDM'03 Technical Digest (IEEE International, 2003).