Electron beam induced changes in the refractive index and film thickness of amorphous AsxS100−x and AsxSe100−x films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368915
Reference32 articles.
1. Photostructural transformations in amorphous As2Se3 and As2S3 films
2. Extended X-ray absorption fine-structure spectroscopy study of photostructural changes in amorphous arsenic chalcogenides
3. Evidence for As4S6 molecule as a structural model for amorphous arsenic sulfide from mass spectrometric analysis
4. New analytic method for investigation of the distribution of bonds in As-S system
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