In situmonitoring of molecular beam epitaxy using specularly scattered ion beam current oscillations
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.119020
Reference13 articles.
1. Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K
2. The surface morphology of a growing crystal studied by thermal energy atom scattering (TEAS)
3. Reentrant layer-by-layer growth during molecular-beam epitaxy of metal-on-metal substrates
4. Characterization of vapor phase growth using X-ray techniques
5. Origin of surface-state photoemission intensity oscillation during Si epitaxial growth on a Si(100) surface
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1. Surface Structure of Ultrathin Fe Films on Cu(001) Revisited;Physical Review Letters;2005-08-18
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