Modeling, design, and analysis of interferometric cantilevers for time-resolved force measurements in tapping-mode atomic force microscopy
Author:
Funder
National Science Foundation
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3553852
Reference23 articles.
1. Atomic Force Microscope
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5. Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever
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3. A dynamic-difference approach to scan probe microwave reflectivity mapping of the nanoscale electronic properties of single-walled carbon nanotubes;Journal of Applied Physics;2019-05-07
4. Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application;Surface Science Tools for Nanomaterials Characterization;2015
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