Deformation, Contact Time, and Phase Contrast in Tapping Mode Scanning Force Microscopy
Author:
Affiliation:
1. Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, Parque Tecnológico de Madrid, 28760 Tres Cantos, Madrid, Spain
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la960189l
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