Tailored probes for atomic force microscopy fabricated by two-photon polymerization-Reference-Cited by-同舟云学术

Tailored probes for atomic force microscopy fabricated by two-photon polymerization

Published:2016-08-08 Issue:6 Volume:109 Page:063101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Göring Gerald¹,Dietrich Philipp-Immanuel²³,Blaicher Matthias²³,Sharma Swati²,Korvink Jan G.²^ORCID,Schimmel Thomas¹⁴,Koos Christian²³,Hölscher Hendrik²

Affiliation:

1. Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany

2. Institute for Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany

3. Institute of Photonics and Quantum Electronics (IPQ), Karlsruhe Institute of Technology (KIT), Engesserstraße 5, 76131 Karlsruhe, Germany

4. Institute of Applied Physics (APH), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, 76131 Karlsruhe, Germany

Funder

Karlsruhe Nano Micro Facility (KNMF)

European Research Council (ERC)

Deutsche Forschungsgemeinschaft (DFG)

Alfried Krupp von Bohlen und Halbach-Stiftung (Alfried Krupp von Bohlen und Halbach Foundation)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4960386

Reference29 articles.

1. Scanning Probe Microscopy

2. Atomic Force Microscopy

3. Tip artefacts in scanning force microscopy

4. Atomic force probe for sidewall scanning of nano- and microstructures

5. An atomic force microscope tip designed to measure time-varying nanomechanical forces

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