Transmission electron microscopy and cathodoluminescence of tensile‐strained GaxIn1−xP/InP heterostructures. II. On the origin of luminescence heterogeneities in tensile stress relaxed GaxIn1−xP/InP heterostructures-Reference-Cited by-同舟云学术

Transmission electron microscopy and cathodoluminescence of tensile‐strained GaxIn1−xP/InP heterostructures. II. On the origin of luminescence heterogeneities in tensile stress relaxed GaxIn1−xP/InP heterostructures

Published:1996-07-15 Issue:2 Volume:80 Page:837-845
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:

Author:

Cléton F.¹,Sieber B.¹,Bensaada A.²,Masut R. A.²,Bonard J. M.³,Ganière J. D.³

Affiliation:

1. Laboratoire de Structure et Propriétés de I'Etat Solide, URA CNRS 234, Bâtiment C6, Université des Sciences et Technologies de Lille, 59655 Villeneuve d'Ascq Cedex, France

2. Groupe de Recherche en Physique et Technologie des Couches Minces, Université de Montréal, C.P. 6218, Montréal, Québec H3C 3A7, Canada

3. IMO, Département de Physique, Ecole Polytechnique Fédérale de Lausanne, CH 1015 Lausanne, Switzerland

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference15 articles.

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2. F. Cléton, B. Sieber, L. Isnard, R. A. Masut, J. M. Bonard, and J. D. Ganière, Semicond. Sci. Technol. 11, 726 (1996).SSTEET0268-1242

3. A. Bensaada, A. Chennouf, R. W. Cochrane, R. Leonelli, P. Cova, and R. A. Masut, J. Appl. Phys. 71, 1737 (1992); JAPIAU0021-8979

4. A. Bensaada, R. W. Cochrane, R. A. Masut, R. Leonelli, and G. Kajrys, J. Cryst. Growth 130, 433 (1993).JCRGAE0022-0248

5. C. De Meerschman, B. Sieber, J. L. Farvacque, and Y. Druelle, Microscop. Microanal. Microstruc. 3, 486 (1992).MMMIEY1154-2799

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