Reconstruction of the charge collection probability in a semiconductor diode from collection efficiency measurements by the regularization method
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.347575
Reference12 articles.
1. Charge collection scanning electron microscopy
2. Electron beam depth profiling in semiconductors
3. Investigation of minority‐carrier diffusion lengths by electron bombardment of Schottky barriers
4. Determination of Semiconductor Parameters and of the Vertical Structure of Devices by Numerical Analysis of Energy-Dependent EBIC Measurements
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