Measuring temperature-dependent thermal diffuse scattering using scanning transmission electron microscopy-Reference-Cited by-同舟云学术

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Measuring temperature-dependent thermal diffuse scattering using scanning transmission electron microscopy

Published:2018-12-17 Issue:25 Volume:113 Page:253101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Wehmeyer Geoff¹^ORCID,Bustillo Karen C.²,Minor Andrew M.²³⁴,Dames Chris¹⁴

Affiliation:

1. Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, USA

2. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

3. Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA

4. Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

Funder

National Science Foundation

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5066111

Reference33 articles.

1. Nanoscale thermal transport. II. 2003–2012

2. Microscale and Nanoscale Thermal Characterization Techniques

3. Nanoscale thermal probing

4. SCANNING THERMAL MICROSCOPY

5. Scanning Probe Microscopy for Thermal Transport Measurements

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