Experimental evidence of harmful exciton dissociation at MoO3/CuPc interface in OPV-Reference-Cited by-同舟云学术

Experimental evidence of harmful exciton dissociation at MoO3/CuPc interface in OPV

Published:2016-10-14 Issue:14 Volume:120 Page:145501
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Yu A. R.¹,Yi R. C.¹,Zhang J. W.¹,Qin J. J.¹,Yu H. M.¹,Tang Y. J.¹,Shi R. C.¹,Hou X. Y.¹^ORCID

Affiliation:

1. State Key Laboratory of Surface Physics, Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education) and Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433, China

Funder

National Natural Science Foundation of China (NSFC)

Ministry of Science and Technology of the People's Republic of China (MOST)

Science and Technology Commission of Shanghai Municipality (STCSM)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4964748

Reference24 articles.

1. Transition Metal Oxides for Organic Electronics: Energetics, Device Physics and Applications

2. Efficient Polymer Light-Emitting Diode Using Air-Stable Metal Oxides as Electrodes

3. Efficient polymer photovoltaic cells using solution-processed MoO3 as anode buffer layer

4. Improved performances of organic light-emitting diodes with metal oxide as anode buffer

5. Performance improvement of inverted polymer solar cells with different top electrodes by introducing a MoO3 buffer layer

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