Characterization and annealing behavior of deep levels in CdTe epitaxial layers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.331330
Reference8 articles.
1. Applications of CdTe. A review
2. The defect structure of CdTe
3. Hot wall epitaxy
4. Fast capacitance transient appartus: Application to ZnO and O centers in GaP p‐n junctions
5. Double correlation technique (DDLTS) for the analysis of deep level profiles in semiconductors
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