Determination of critical layer thickness and strain tensor in InxGa1−xAs/GaAs quantum‐well structures by x‐ray diffraction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.354030
Reference20 articles.
1. X-Ray Double Crystal Diffractometry of Multiple and Very Thin Heteroepitaxial Layers
2. X-ray scattering from a single-quantum-well heterostructure
3. X‐ray interference in quantum‐well laser structures
4. Interference peaks in double‐crystal x‐ray rocking curves of laser structures
5. X‐ray interferometry and its application to determination of layer thickness and strain in quantum‐well structures
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