Determination of the temperature coefficient of resistance from micro four-point probe measurements-Reference-Cited by-同舟云学术

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Determination of the temperature coefficient of resistance from micro four-point probe measurements

Published:2021-04-28 Issue:16 Volume:129 Page:165105
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Marangoni Thomas A.¹²^ORCID,Guralnik Benny¹³^ORCID,Borup Kasper A.⁴^ORCID,Hansen Ole⁵^ORCID,Petersen Dirch H.¹^ORCID

Affiliation:

1. Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, Building 310, DK-2800 Kgs. Lyngby, Denmark

2. Department of Physics, Technical University of Denmark, Fysikvej, Building 307, DK-2800 Kgs. Lyngby, Denmark

3. CAPRES—a KLA company, Diplomvej 373, 2800 Kgs. Lyngby, Denmark

4. Department of Chemistry, Aarhus University, Langelandsgade 140, DK-8000 Aarhus C, Denmark

5. National Centre for Nano Fabrication and Characterization, DTU Nanolab, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark

Funder

Innovation fund Denmark

Independent Research Fund Denmark

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0046591

Reference48 articles.

1. The measurement, use and interpretation of the temperature coefficient of resistance of metallizations

2. The Mayadas-Shatzkes conduction model treated as a Fuchs-Sondheimer model

3. Experimental verification of temperature coefficients of resistance for uniformly doped P-type resistors in SOI

4. Modelling of Thermal Behavior N-Doped Silicon Resistor

5. Studies on the temperature dependence of electric conductivity for metals in the Nineteenth Century: a neglected chapter in the history of superconductivity

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe;Measurement Science and Technology;2024-04-02

2. Deconvolution of heat sources for application in thermoelectric micro four-point probe measurements;International Journal of Thermal Sciences;2024-02

3. Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method;Materials Today Physics;2023-02

4. Determination of thermoelectric properties from micro four-point probe measurements;Measurement Science and Technology;2022-09-05

5. Review of Micro- and Nanoprobe Metrology for Direct Electrical Measurements on Product Wafers;2022 China Semiconductor Technology International Conference (CSTIC);2022-06-20

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