SRF niobium characterization using SIMS and FIB-TEM
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AIP Publishing LLC
Reference32 articles.
1. L.A. Giannuzzi and F.A Stevie, editors, Introduction to Focused Ion Beams: Theory, Instrumentation, Applications, and Practice, Springer, NY (2005).
2. J. Orloff, M. Utlaut, and L. W. Swanson, High Resolution Focused Ion Beams: FIB and its Applications, Kluwer Academic/Plenum Publishers (2002)
3. Applications of the FIB lift-out technique for TEM specimen preparation
4. A review of focused ion beam milling techniques for TEM specimen preparation
5. L. A. Giannuzzi, R. Young, P. Carlson, and F. Stevie, Microscopy Today 99-2, February March 1999, pp. 12, 14.
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