Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1332410
Reference12 articles.
1. First order gain‐coupled GaInAs/GaAs distributed feedback laser diodes patterned by focused ion beam implantation
2. Focused ion-beam implantation induced thermal quantum-well intermixing for monolithic optoelectronic device integration
3. On the amorphization process in Al0.6Ga0.4As/GaAs heterostructures
4. On the amorphization process in Al0.6Ga0.4As/GaAs heterostructures
5. Double-crystal X-ray diffraction analysis of low-temperature ion implanted silicon
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3. Grazing-incidence diffraction strain analysis of a laterally patterned Si wafer treated by focused Ge and Au ion beam implantation;physica status solidi (a);2005-05
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