Digital model for X-ray diffraction with application to composition and strain determination in strained InAs/GaSb superlattices-Reference-Cited by-同舟云学术

Digital model for X-ray diffraction with application to composition and strain determination in strained InAs/GaSb superlattices

Author:

Meng Yifei¹²,Kim Honggyu¹²,Rouviére Jean-Luc³,Isheim Dieter⁴⁵,Seidman David N.⁴⁵,Zuo Jian-Min¹²

Affiliation:

1. Department of Materials Science & Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA

2. Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA

3. CEA/INAC/SP2M/LEMMA, 19 rue des Martyrs, 38054 Grenoble, France

4. Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA

5. Northwestern University Center for Atom-Probe Tomography (NUCAPT), Northwestern University, Evanston, Illinois 60208, USA

Funder

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

Reference57 articles.

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