Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://scitation.aip.org/deliver/fulltext/aip/journal/apl/105/4/1.4891882.pdf?itemId=/content/aip/journal/apl/105/4/10.1063/1.4891882&mimeType=pdf&containerItemId=content/aip/journal/apl
Reference17 articles.
1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
3. Observation of Electronic States on Si(111)-(7×7)through Short-Range Attractive Force with Noncontact Atomic Force Spectroscopy
4. A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy
5. Forces and frequency shifts in atomic-resolution dynamic-force microscopy
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2. Highly sensitive and reversible MXene-based micro quartz tuning fork gas sensors with tunable selectivity;npj 2D Materials and Applications;2024-03-06
3. Enhancement of Q factor in quartz tuning fork force sensors for atomic force microscopy through counter piezo excitation;Mechanical Engineering Journal;2024
4. Perspective chapter: Experiments in Entangled Time;Quantum Entanglement in High Energy Physics [Working Title];2023-12-07
5. Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes;Microsystems & Nanoengineering;2022-05-16
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