Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon-Reference-Cited by-同舟云学术

Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon

Published:2015-06 Issue:6 Volume:5 Page:067168
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Schinke Carsten¹,Christian Peest P.¹^ORCID,Schmidt Jan¹²,Brendel Rolf¹²,Bothe Karsten¹,Vogt Malte R.²^ORCID,Kröger Ingo³,Winter Stefan³,Schirmacher Alfred³,Lim Siew⁴,Nguyen Hieu T.⁴^ORCID,MacDonald Daniel⁴

Affiliation:

1. Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, 31860 Emmerthal, Germany

2. Leibniz University of Hanover (LUH), Institute for Solid State Physics, Appelstraße 2, 30167 Hannover, Germany

3. Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany

4. The Australian National University (ANU), College of Engineering and Computer Science, Canberra, ACT 0200, Australia

Funder

State of Lower Saxony

Deutsche Forschungsgemeinschaft (DFG)

Gottfried Wilhelm Leibniz Universität Hannover (Leibniz University Hannover)

Deutsche Bundesstiftung Umwelt (German Federal Environmental Foundation)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://scitation.aip.org/deliver/fulltext/aip/journal/adva/5/6/1.4923379.pdf?itemId=/content/aip/journal/adva/5/6/10.1063/1.4923379&mimeType=pdf&containerItemId=content/aip/journal/adva

Reference58 articles.

1. Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°K

2. Infrared Absorption of Silicon Near the Lattice Edge

3. Infrared Refractive Indexes of Silicon Germanium and Modified Selenium Glass*

4. Infrared Absorption inn-Type Silicon

5. Fine Structure in the Absorption-Edge Spectrum of Si

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