Analytical models for coupling reliability in identical two-magnet systems during slow reversals
Author:
Affiliation:
1. Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA
Funder
Semiconductor Research Corporation
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4996934
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1. Benchmarking of Beyond-CMOS Exploratory Devices for Logic Integrated Circuits
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