Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2732685
Reference26 articles.
1. Frontiers of silicon-on-insulator
2. The low-frequency noise behaviour of silicon-on-insulator technologies
3. Comprehensive study on low-frequency noise characteristics in surface channel SOI CMOSFETs and device design optimization for RF ICs
4. SOI n-MOSFET low-frequency noise measurements and modeling from room temperature up to 250°C
5. Gate-induced floating body effect excess noise in partially depleted SOI MOSFETs
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