Analysis of the scanning electron microscope mirror image based on the dielectric surface microstructure
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.356043
Reference8 articles.
1. Charging Effect of Specimen in Scanning Electron Microscopy
2. Radiation induced charges IN SiO2
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5. Breakdown phenomena related to trapping/detrapping processes in wide band gap insulators
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4. Study of dynamic behavior of trapped charge in the insulating materials by using a new experimental approach;Journal of Electrostatics;2014-02
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