Approximations of Minimum Approach Distance in Electron Mirroring Phenomena

Abstract

Abstract The minimum approaches distance of probing electrons in scanning electron microscope has investigated in accordance to mirror effect phenomenon. The analytical expression for such distance is decomposed using the binomial expansion. With aid of resulted expansion, the distribution of trapped electrons within the sample surface has explored. Results have shown that trapped electron distributes with various forms rather an individual one. The domination of any shape is mainly depend on the minimum approaches distance of probing electrons