Observation of ultrafast amorphization dynamics in GeCu2Te3 thin films using echelon-based single-shot transient absorbance spectroscopy-Reference-Cited by-同舟云学术

Observation of ultrafast amorphization dynamics in GeCu2Te3 thin films using echelon-based single-shot transient absorbance spectroscopy

Published:2021-08-09 Issue:6 Volume:119 Page:061102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Arashida Yusuke¹²,Suzuki Takayuki¹,Nara Shuhei¹,Katayama Ikufumi¹,Minami Yasuo¹³^ORCID,Shindo Satoshi⁴,Sutou Yuji⁴^ORCID,Saiki Toshiharu⁵^ORCID,Takeda Jun¹^ORCID

Affiliation:

1. Department of Physics, Graduate School of Engineering Science, Yokohama National University, Yokohama 240-8501, Japan

2. Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-8573 Japan

3. Graduate School of Technology, Industrial and Social Sciences, Tokushima University, Tokushima 770-8506, Japan

4. Department of Materials Science, Tohoku University, Sendai 980-8579, Japan

5. Department of Electronics and Electrical Engineering, Keio University, Yokohama 223-8522, Japan

Funder

Japan Society for the Promotion of Science

JSPS bilateral program

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0052872

Reference31 articles.

1. Phase-change materials for rewriteable data storage

2. Phase-change random access memory: A scalable technology

3. Phase Change Memory

4. Phase change memory technology

5. Low-cost and nanoscale non-volatile memory concept for future silicon chips

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The microstructure and electrical and optical properties of Ge–Cu–Te phase-change thin films;CrystEngComm;2024

2. Terahertz wave emission with 1.5 μm pump from photoconductive antenna using stacked Er-doped-InAs quantum dot layers with ultrafast carrier relaxation;Journal of Applied Physics;2023-10-09

3. Collective excitations in a melt of fast phase change material GeCu₂Te₃;Journal of Physics: Condensed Matter;2023-03-29