Measurement of interfacial thermal conductance of few-layer MoS2 supported on different substrates using Raman spectroscopy-Reference-Cited by-同舟云学术

Measurement of interfacial thermal conductance of few-layer MoS2 supported on different substrates using Raman spectroscopy

Author:

Yue Xiao Fei¹,Wang Ying Ying¹^ORCID,Zhao Yi²,Jiang Jie³,Yu Kai³,Liang Yao⁴,Zhong Bo⁵,Ren Shou Tian¹,Gao Ren Xi¹,Zou Ming Qiang⁶

Affiliation:

1. Department of Optoelectronic Science, Harbin Institute of Technology at Weihai, Weihai 264209, China

2. China Inspection Laboratory Technologies Co. Ltd. (CILT), No. A 3, Gaobeidian Road, Chaoyang District, Beijing 100123, China

3. School of Marine Science and Technology, Harbin Institute of Technology at Weihai, Weihai 264209, China

4. School of Materials Science and Engineering, Dalian Jiaotong University, Dalian 116028, China

5. School of Materials Science and Engineering, Harbin Institute of Technology at Weihai, Weihai 264209, China

6. Chinese Academy of Inspection and Quarantine (CAIQ), No. A 3, Gaobeidian Road, Chaoyang District, Beijing 100123, China

Funder

National Key Research and Development Program of China

Dalian Youth Science and Technology Star Project

Liaoning Education Department

Beijing Science and technology plan

National Nature Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

Reference41 articles.

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献