At-wavelength metrology facility for soft X-ray reflection optics
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4950731
Reference20 articles.
1. Installation of a technological center for highly efficient optical gratings at Helmholtz-Zentrum Berlin (HZB)
2. Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light
3. High-accuracy radiometry in the EUV range at the PTB soft x-ray beamline
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